Total Books: 1 - 2 /2
EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the ...
Lire la suite
Intense Electron and Ion Beams
Intense Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental ...
Lire la suite
Total Books: 1 - 2 /2
